{"id":666,"date":"2021-12-01T15:04:33","date_gmt":"2021-12-01T06:04:33","guid":{"rendered":"https:\/\/shi-mechatronics.sakura.ne.jp\/en\/?post_type=case&p=666"},"modified":"2024-03-06T11:59:07","modified_gmt":"2024-03-06T02:59:07","slug":"offering-real-time-water-surface-monitoring-and-stable-quality-control-for-wafer-surface-during-the-manufacturing-of-power-semiconductors","status":"publish","type":"case","link":"https:\/\/www.shi-mechatronics.jp\/solutions\/en\/case\/laserannealing\/666\/","title":{"rendered":"Offering real-time water surface monitoring and stable quality control for wafer surface during the manufacturing of power semiconductors"},"featured_media":1036,"template":"","article_category":[89],"tech":[],"feature":[],"_links":{"self":[{"href":"https:\/\/www.shi-mechatronics.jp\/solutions\/en\/wp-json\/wp\/v2\/case\/666"}],"collection":[{"href":"https:\/\/www.shi-mechatronics.jp\/solutions\/en\/wp-json\/wp\/v2\/case"}],"about":[{"href":"https:\/\/www.shi-mechatronics.jp\/solutions\/en\/wp-json\/wp\/v2\/types\/case"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.shi-mechatronics.jp\/solutions\/en\/wp-json\/wp\/v2\/media\/1036"}],"wp:attachment":[{"href":"https:\/\/www.shi-mechatronics.jp\/solutions\/en\/wp-json\/wp\/v2\/media?parent=666"}],"wp:term":[{"taxonomy":"article_category","embeddable":true,"href":"https:\/\/www.shi-mechatronics.jp\/solutions\/en\/wp-json\/wp\/v2\/article_category?post=666"},{"taxonomy":"tech","embeddable":true,"href":"https:\/\/www.shi-mechatronics.jp\/solutions\/en\/wp-json\/wp\/v2\/tech?post=666"},{"taxonomy":"feature","embeddable":true,"href":"https:\/\/www.shi-mechatronics.jp\/solutions\/en\/wp-json\/wp\/v2\/feature?post=666"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}